"CCD image sensors continue to provide the critical image quality required in many key applications," said Chris McNiffe, VP Image Sensor Business unit at ON Semiconductor. "The enhanced performance available from the new KAI-08051 Image Sensor reflects our on-going commitment to improve the capability of our existing products and to deliver the industry’s most advanced image sensors using both CCD and CMOS technology."
ON Semi Announces Improved 8MP CCD
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Business Wire: ON Semi's new KAI-08051 CCD provides improved light sensitivity, reduced read noise, and improved color accuracy compared to the previous generation device for applications such as Intelligent Traffic, Surveillance, Medical Imaging, and Industrial Inspection. The KAI-08051 shares the same 5.5um pixel architecture, 8MP resolution, 15fps readout rate, and 4/3 optical format as the existing KAI-08050, but improves its performance through the use of an improved amplifier design, newly optimized microlens structure, and new color filter pigments in both Bayer and Sparse color configurations. The KAI-08051 is backward compatible with the KAI-08050, requiring at most minor modifications to the firmware used in existing camera designs.
"CCD image sensors continue to provide the critical image quality required in many key applications," said Chris McNiffe, VP Image Sensor Business unit at ON Semiconductor. "The enhanced performance available from the new KAI-08051 Image Sensor reflects our on-going commitment to improve the capability of our existing products and to deliver the industry’s most advanced image sensors using both CCD and CMOS technology."
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"CCD image sensors continue to provide the critical image quality required in many key applications," said Chris McNiffe, VP Image Sensor Business unit at ON Semiconductor. "The enhanced performance available from the new KAI-08051 Image Sensor reflects our on-going commitment to improve the capability of our existing products and to deliver the industry’s most advanced image sensors using both CCD and CMOS technology."