Albert Theuwissen announced the new book “Single-Photon Imaging” published by Springer (ISBN 978-3-642-18442-0). The book talks about a broad range of technologies minimizing sensors noise level to the single electrons level. The editors Albert Theuwissen and Peter Seitz managed to assemble a team of world's experts to write the chapters for the book:
- Fundamentals of Noise in Optoelectronics
Peter Seitz - Image Sensor Technology
R. Daniel McGrath - Hybrid Avalanche Photodiode Array Imaging
Hiroaki Aihara - Electron Bombarded Semiconductor Image Sensors
Verle Aebi and Kenneth Costello - Single-Photon Imaging Using ElectronMultiplication in Vacuum
Gert Nutzel - Electron-Multiplying Charge Coupled Devices – EMCCDs
Mark Stanford Robbins - Monolithic Single-Photon Avalanche Diodes: SPADs
Edoardo Charbon and Matthew W. Fishburn - Single Photon CMOS Imaging Through Noise Minimization
Boyd Fowler - Architectures for Low-noise CMOS Electronic Imaging
Shoji Kawahito - Low-Noise Electronic Imaging with Double-Gate FETs and Charge-Modulation Devices
Yoshiyuki Matsunaga - Energy-Sensitive Single-Photon X-ray and Particle Imaging
Christian Lotto - Single-Photon Detectors for Time-of-Flight Range Imaging
David Stoppa and Andrea Simoni - Single-Photon Imaging for Astronomy and Aerospace Applications
Pierre Magnan - Exploiting Molecular Biology by Time-Resolved Fluorescence Imaging
Francis Muller and Christof Fattinger
