Agilent Device Analyzer Targets RTN MeasurementsWhile not a fresh news, Agilent newly enhanced B1500A Semiconductor Device Analyzer features WGFMU measurement module with RTN noise measuring capability. It appears that RTN characterization market becomes large enough to wa…Read More
Fujitsu Journal ISP IssueFujitsu Scientific and Technical Journal, Vol 49, No. 1 is entirely devoted to the company's image processing LSIs, including its Milbeaut ISPs for DSCs and mobile phones. The scope of the articles spans from the ISPs descrip…Read More
IISW 2013, Day 3 ReportAlbert Theuwissen continues his review of IISW 2013 news. Day 3 part covers CCD and CMOS presentations and invited talk by Mike Tompsett.…Read More
Billion Pixels from MarsNASA assembled a Giga-pixel panorama from few hundreds of pixels pictures sent by Curiosity rover. Impressive achievement!…Read More